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KMID : 0385519900030030301
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Analytical Science & Technology
1990 Volume.3 No. 3 p.301 ~ p.311
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Proton Induced X-ray Exission Analysis System and Test Analysis of Reference Materials
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金洛培/Kim, Nak Bae
禹亨柱/金德卿/崔漢羽/金俊坤/Woo, Hyung Joo/Kim, Duk Kyung/Choi, Han Woo/Kim, Joon Kon
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Abstract
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PIXE analysis system
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KEYWORD
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FullTexts / Linksout information
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Listed journal information
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